A Novel Method for the Design of Digital System Fault Diagnosis Instrument Based on VXI Bus

Abstract

To meet the requirements of the testing for modern complex digital systems and devices, A novel method for the design of digital system fault diagnosis instrument based on VXI bus is described in this paper, and the composition and design principle of the hardware of the presented method is introduced in the paper. The instrument designed with the novel method provides 64 pins of Transistor-Transistor Logic (TTL) digital I/O for the test of digital modules and systems. Testing can be automatic accomplished by programming a sequence of test vectors. Real-time data comparison ensures fast test execution by eliminating the post processing of test data. Branching and test execution pause enhance the ability to synchronize the test system to activity of the unit under test (UUT). The experimental results show the module designed with the presented method has much more higher performance than the only similar manufacture VX4820.