Affiliation:
1. Wuhan University of Science and Technology
Abstract
Aiming at the problem of capsule defect species diversity and classification difficulty in the process of actual capsule defect detection, this paper extracts capsule defect feature based on capsule texture, shape and capsule defect region by edge detector, and then applies hierarchical SVMs multi-class classification to classifying. In order to resolve the problems of training data imbalance and the hierarchical SVM error accumulation, a algorithm of constructing hierarchical structure is proposed that takes the principle of dividing all sample data into two more imbalanced categories according to the length of training data, and then considering significant degree of capsule defect and the probability level of capsule defect occurrence. The experimental results show that compared with the method of BP neural network, the hierarchical SVMs achieved a better classification result.
Publisher
Trans Tech Publications, Ltd.
Reference8 articles.
1. Zhong H, Miao C, Shen Z, et al. Comparing the Learning Effectiveness of BP, ELM, I-ELM, and SVM for Corporate Credit Ratings[J]. Neurocomputing, (2013).
2. Cheng L, Zhang J, Yang J, et al. An improved hierarchical multi-class support vector machine with binary tree architecture[C]/Internet Computing in Science and Engineering, 2008. ICICSE'08. International Conference on. IEEE, 2008: 106-109.
3. Xu X, Xu S, Jin L, et al. Characteristic analysis of Otsu threshold and its applications[J]. Pattern recognition letters, 2011, 32(7): 956-961.
4. Wu De. The research of the capsule detection system based on image processing [D]Guangzhou: Guangdong University of Technology, 2011. (In Chinese).
5. Wang Juan, Zhou Yongxia, et al. Image processing in capsule shape defect detection [J]. Journal of China University of Metrology, 2012, 23 (3): 239-245. (In Chinese).
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. An Advanced Edge Intelligent Approach for Capsule Defect Recognition Based on CNN Using an Embedded Platform;2023 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD);2023-11-02
2. Capsule defect detection method based on Improved Faster RCNN;2023 5th International Conference on Electronics and Communication, Network and Computer Technology (ECNCT);2023-08-18
3. Development of tablet defect detection model using biaxial planes discrete scanning algorithm;The International Journal of Advanced Manufacturing Technology;2023-08-14
4. Surface Quality Automatic Inspection for Pharmaceutical Capsules Using Deep Learning;Journal of Sensors;2022-08-26
5. A Deep Learning-Based Model for Automated Quality Control in the Pharmaceutical Industry;2022 IEEE 46th Annual Computers, Software, and Applications Conference (COMPSAC);2022-06