Three-Dimensional Micro-Displacement Control System for a Conductor Defect Detection System

Abstract

This paper proposes a method to detect conductor defects in the field of modern non-destructive testing technology. A self-magnetic field induced by flowing current in the conductor is used in the detection technique, and a three-dimensional micro-displacement stage platform is used to scan the sample surface to obtain the self-magnetic field mapping of the whole sample. The subsequent data processing and imaging technology of the detection signal is also developed. To achieve precise positioning of the triaxial directions, an STM32 microcontroller (MCU) is used as the central processor to design the displacement control system, which communicates with a PC computer through the MCU system. The experimental results demonstrate that the stepper motor driving the magnetic sensor could run uniformly and that the proposed system has the advantages of smooth motion, low noise and high precision. As a consequence, the micro-displacement control system can be used to get a clear mapping of the defects in the sample.