Versatile Aqueous Chemistry for Selective Ru or WNx Etch and Implant BARC Removal in 5- and 3-nm Applications

Author:

Hsu Chien Pin Sherman1,Chen Polly Yi Ting1

Affiliation:

1. Avantor

Abstract

Ruthenium (Ru) is considered for use as a barrier-less metallization interconnect offering low effective resistivity in advanced sub-5nm semiconductor applications. A fully aqueous, environmentally friendly chemistry has been developed for effective Ru etching with broad substrate and metallization compatibilities. This alkaline oxidative chemistry is suitable for versatile etch/clean applications, including highly selective etch of SiGe, Si, Al, W, WNx and other W alloys. Its heavy hydrocarbon and residue removal capability are demonstrated as a Cu/TiN compatible, SPM alternative in multilayer PR/BARC stripping and implant BARC removal.

Publisher

Trans Tech Publications, Ltd.

Subject

Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics

Reference4 articles.

1. L. G. Wen et.al., ACS Appl. Mater. Interfaces, 8(39), pp.26119-26125 (2016).

2. H. Aoki, K. Watanabe, T. Iizuka, N. Ishikwa and K. Mori, Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials, Tokyo,200l, pp.20-21.

3. M. Nakahara et. Al, J. Vac.Sci, Technol. B, 19, 2133 (2001).

4. X. Ma, H. Yang, W. Wang, H. Yin, H. Zhu, C, Zhao, D. Chen, and T. Ye. J. Semicond., 35(9), 096001-1 (2014).

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