Abstract
Application potential of ZnO nanowires grown by MOCVD for atomic force microscope
(AFM) probes was evaluated by predicting numerically their structural performances in terms of
flexural stiffnesses and natural frequencies. Estimated properties of the nanowires suggested that they
are structurally compatible with typical AFM cantilevers while maintaining mechanical stability
during operation and they are therefore promising candidates for high aspect ratio probes.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
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