Abstract
A short account of the methodology used within FullProf to extract average micro-structural properties from the analysis of broadened lines of constant wavelength diffraction patterns is presented. The approach is based on the Voigt approximation and can be combined with the Rietveld method as well as with the profile matching (Le Bail fit) procedure. Both the instrumental and sample profiles are supposed to be well described by Voigt functions. To get
reliable sample parameters a good knowledge of the Instrumental Resolution Function (IRF) is needed. Only a phenomenological treatment, in terms of coherent size domains and strains due to structural defects, is performed.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference9 articles.
1. R. L. Snyder, H. J. Bunge and J. Fiala: Defect and Microstructure Analysis from Diffraction (International Union of Crystallography, Oxford Science Publications, 1999).
2. P. Thompson, D.E. Cox and J.B. Hastings: J. Appl. Cryst. 20 (1987), p.79.
3. L.W. Finger: J. Appl. Cryst. 31 (1998), p.111; L.W. Finger, D.E. Cox and A. Jephcoat, J. Appl. Cryst. 27 (1997), p.892.
4. T. Roisnel and J. Rodríguez-Carvajal: Mater. Sci. Forum 378-381 (2000), p.118 (WinPLOTR on LLB Web site at: http: /www-llb. cea. fr/fullweb/winplotr/winplotr. htm).
5. A. Guinier (Dunod editor, Paris 1956).
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