Calculations of Absorbed Dose in Heavy-Ion Irradiated Phase-Change Memory Cells

Author:

Zdjelarević Nevena1,Timotijević Ljubinko1,Marić Radeta2,Stanković Koviljka1,Vujisić Miloš1

Affiliation:

1. University of Belgrade

2. Electric Power Industry of Serbia

Abstract

Heavy ion irradiation on phase change memory cell was conducted using Monte Carlo simulations. Absorbed dose in the whole memory cell, as well as in its active layer was assessed. Phase change memory cell was modeled as a sandwiched structure of two TiW electrodes and ZnS-SiO2 films as insulators surrounding the active region. The most commonly used phase change material, Ge2Sb2Te5, was used as active layer of the cell. Ionization effects of heavy ion irradiation were investigated for various thicknesses of phase change layer and different ion energies.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Reference15 articles.

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4. A. Gasperin, Advanced Non-Volatile Memories: Reliability and Ionizing Radiation Effects, Scuola di Dottorato in Ingegneria dell'Informazione, University of Padova, (2008).

5. A.P. Ferreira et al., Using PCM in Next-generation Embedded Space Applications, 16th Real-Time and Embedded Technology and Applications Symposium, IEEE (2010) 153-162.

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