Noise Analysis and Characterization of a CMOS Interface Circuit for Fluxgate Sensor

Author:

Dong Chang Chun1,Jiang Zhan Peng1

Affiliation:

1. Harbin University of Science and Technology

Abstract

In this paper, noise analysis and characterization of a 5V CMOS interface circuit for the fluxgate is presented, which is based on second-harmonic detection of the output voltage. The circuit consists of oscillator, band pass filter, phase sensitive demodulation, low pass filter. The chip is fabricated in the 0.5μm two–metal and two-poly n-well CMOS process with an area of 4 mm2. Experimental results shows, the system exhibits a sensitivity of 16.5μV/nT for a magnetic field range of ±90μT in open-loop with 5kHz excitation frequency. Using 5V supply voltage, the power consumption of the system is measured to be 35 mW.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Reference12 articles.

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