Relative Analysis of GaAs, InSb, InP Using QWFET
Author:
Affiliation:
1. Infant Jesus College of Engineering and Technology
2. RMK College of Engineering and Technology
3. Manonmaniam Sundaranar University
Abstract
Publisher
Trans Tech Publications, Ltd.
Subject
General Engineering
Link
https://www.scientific.net/AMR.984-985.1080.pdf
Reference17 articles.
1. H. J. Hellman, J. Chem. Phys., 3 (1935) 61.
2. Gorczycat et al; Pseudopotential and k. p band parameter for GaAs, InP and InSb. Semicond. Sci. Technol. 6 (1991).
3. Jun Sato, Yutaro Nagai, et al;. Analysis of Performances of InSb HEMTs Using Quantum-Corrected Monte Carlo Simulation. 2013 IEEE. PP237 -240.
4. Hai Dang Trinh et. al. Electrical Characteristics of Al2O3/InSb MOSCAPs and the Effect of Postdeposition Annealing Temperatures. IEEE transactions on electron devices, VOL. 60, NO. 5, MAY 2013. PP: 1555-1560.
5. R. Vaid and R. Prasher. Exploring InSb as Novel Channel Material for Nanoscale Devices using Simulation Approach. PROC. MIEL 2012, MAY, 2012, PP: 119-122.
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