XPS Research on SrTiO3-Based Voltage-Sensitive Material
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Published:2008-02
Issue:
Volume:368-372
Page:535-537
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ISSN:1662-9795
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Container-title:Key Engineering Materials
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language:
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Short-container-title:KEM
Author:
Xu Yu Xing1,
Tang Zi Long1,
Zhang Zhong Tai1
Abstract
SrTiO3-based voltage-sensitive material was prepared successfully. The structure and
properties were investigated using scanning electron microscopy, X-ray diffraction and X-ray
photoelectron spectroscopy. It was observed that the average grain size was greater than 3μm and a cubic
perovskite structure was obtained. XPS analysis of oxygen indicated that there existed multiform
chemical state oxygen at the surface of the grain. Further researches shown that there were a few [AO12]
polyhedrons and many cation vacancies in the material discussed, which demonstrated that a lot of
oxygen volatilized and a well-known semiconductivity level was achieved.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
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