Affiliation:
1. Institut Pprime CNRS - Université de Poitiers - ENSMA - UPR 3346
2. HCM Society
Abstract
The mechanical properties of die attach system SiC/Au-Ge/Au-Ni-Cu-Si3N4 using the eutectic Au-Ge solder (Teut = 356°C) were investigated in a temperature range up to 300°C. The as-resulting structure of the solder is observed to be lamellar with pockets of high concentration of Au close to the interfaces. The shear strength of joint decreases with temperature but, even at 300°C, its value is well higher than the IEC standard. The creep behavior of Au-Ge solder alloy was also investigated at 300°C for different strain levels. The creep curves show a high creep resistance even for high stress level.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference13 articles.
1. J. Emmerlich, D. Music, P. Eklund, O. Wilhelmsson, U. Jansson, J. M. Schneider, H. Högberg, L. Hultman, J. Acta Materialia 55 (2007) 1479-1488.
2. M. Hecker, R. Hübner, R. Ecke, S. Schulz, H. -J. Engelmann, H. Stegmann, V. Hoffmann, N. Mattern, T. Gessner, E. Zschech, Microelectronic Engineering 64 (2002) 269-277.
3. W. Dorner, H. Mehrer, P. J Pokela, E. Kolawa and M-A Nicolet, Materials Science and Engineering, B10 (1991) 165-169.
4. S. Tanimoto, K. Matsui, Y. Zushi, S. Sato, Y. Murakami, M. Takamori and T. Iseki, Mater. Sci. Forum 853, 717-720, (2012).
5. P. Zheng, A. Wiggins, and R.W. Johnson, R. Frampton, S. J. Adam, L. Peltz, Die Attach for High Temperature Electronics Packaging, International Conference on High Temperature Electronics (HiTEC 2008), Albuquerque, New Mexico USA May 12-15 (2008).
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献