Effect of ZnO Film Thickness on its Optical and Structural Properties

Author:

Pérez-Cuapio Rene1,Pacio Mauricio2,Juarez Hector2,Alvarado Jose Alberto3,Guarneros Cesia4,Bueno Carlos1,Pacio Abraham2

Affiliation:

1. Benemérita Universidad Autónoma de Puebla

2. Centro de Investigación y de Estudios Avanzados del I. P. N.

3. University of Washington

4. Instituto Politécnico Nacional, SEPI-ESIME

Abstract

In this study, we report the effect of ZnO film thickness on its optical and structural properties. The sol solution was synthesized by sol-gel method and deposited on silicon substrates by spin coating technique. The ZnO films thickness was varied from 60 to 180 nm. The ZnO films obtained showed a highly preferred orientation along the (002) plane. It was also observed that the crystallite size was not affected by increasing thickness. Transmittance measurements indicated that the ZnO films have a high transparency in the visible range (~90 %), which remained constant with thickness. Morphological evolution measurements confirmed that the thinner ZnO film consist mostly of a porous layer which became homogeneous and compact to increase the thickness. Photoluminescence measurements exhibit a strong ultraviolet (UV) emission, and the emission intensity was improved with thickness due to crystallinity enhancement.

Publisher

Trans Tech Publications, Ltd.

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