Time-domain approach for analog circuits in deep sub-micron LSI-Reference-Cited by-同舟云学术

Time-domain approach for analog circuits in deep sub-micron LSI

Published:2018 Issue:6 Volume:15 Page:20182001-20182001
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Asada Kunihiro¹,Nakura Toru²,Iizuka Tetsuya¹,Ikeda Makoto²

Affiliation:

1. VLSI Design and Education Center, the University of Tokyo

2. Dept. of Electrical Engineering and Information Systems, the University of Tokyo

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/15/6/15_15.20182001/_pdf

Reference57 articles.

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3. [3] A. M. Abas, et al.: “Time difference amplifier,” IEEE Electronics Letters 38 (2002) 1437 (DOI: 10.1049/el:20020961).

4. [4] M. Lee and A. A. Abidi: “A 9b, 1.25 ps resolution coarse-fine time-to-digital converter in 90 nm CMOS that amplifies a time residue,” IEEE J. Solid-State Circuits 43 (2008) 769 (DOI: 10.1109/JSSC.2008.917405).

5. [5] M. Lee, et al.: “A low noise, wideband digital phase-locked loop based on a new time-to-digital converter with subpicosecond resolution,” IEEE/JSAP Symp. VLSI Circuits Dig. Tech. Papers (2008) 112 (DOI: 10.1109/VLSIC.2008.4585972).

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