Frequency Dependence Measurements of Complex Permittivity of Dielectric Plates Using TE0m1 Modes in a Circular Cavity
Author:
Affiliation:
1. Faculty of Engineering, Saitama University
2. SUMTEC INC., Comprehensive Open Innovation Center, Saitama University
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://www.jstage.jst.go.jp/article/transele/E93.C/7/E93.C_7_1126/_pdf
Reference10 articles.
1. [1] Y. Kobayashi and J. Sato, “Complex permittivity measurement of dielectric plates by a cavity resonance method, ” IEICE Technical Report, EMCJ88-58, MW 88-40, Nov. 1988.
2. Full-wave analysis of a split-cylinder resonator for nondestructive permittivity measurements
3. Round robin test on a cavity resonance method to measure complex permittivity of dielectric plates at microwave frequency
4. [5] H. Nakai, T. Shimizu, Y. Kobayashi, and Z. Ma, “Complex permittivity measurements of dielectric substrates using multimode TE0m1 for empty cavity method, ” Proc. Electron. Conf. IEICE 2008, C-2-45, p.40, Sept. 2008.
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