Observation of Tin Plated Fretting Contacts Using FIB-SEM

Author:

ITO Tetsuya1,NOMURA Yoshiyuki1,HATTORI Yasuhiro1

Affiliation:

1. AutoNetworks Technologies, Ltd.

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. [1] J.M. Hooyer and K. Peekstok, “The influence of practical contact parameters of fretting corrosion of tin-bass low-level connector contacts, ” Proc. Holm Conf. on Electrical Contacts, pp.43-51, 1987.

2. [2] A. Lee and M. Mamrick, “Fretting corrosion of tin plated copper alloy, ” Proc. Holm Conf. on Electrical Contacts, pp.45-50, 1986.

3. [3] M. Antler, “Survey of contact fretting in electrical connectors, ” Proc. Holm Conf. on Electrical Contacts, pp.3-22, 1984.

4. [4] C.E. Heaton and S.L. McCarthy, “High cycle fretting corrosion studies on tin-coated contact materials, ” Proc. Holm Conf. on Electrical Contacts, pp.209-214, 2001.

5. [5] O. Schneegans, F. Houze, P. Chretien, S. Noel, C. Bodir, L. Boyer, and E.M. Zindine, “Fretting degradation of tin-plated contacts studied by means of a new electrical cartography technique based on atomic force microscopy, ” Proc. International Conf. on Electrical Contact Phenomena, pp.187-193, 1998.

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