A New Randomness Test Based on Linear Complexity Profile-Reference-Cited by-同舟云学术

A New Randomness Test Based on Linear Complexity Profile

Published:2009 Issue:1 Volume:E92-A Page:166-172
ISSN:0916-8508
Container-title:IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
language:en
Short-container-title:IEICE Trans. Fundamentals

Author:

HAMANO Kenji¹,SATO Fumio²,YAMAMOTO Hirosuke¹

Affiliation:

1. Department of Complexity Science and Engineering, the University of Tokyo

2. Technical Research & Development Institute, Ministry of Defense

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Signal Processing

Link

http://www.jstage.jst.go.jp/article/transfun/E92.A/1/E92.A_1_166/_pdf

Reference16 articles.

1. [1] J.S. Coron, “On the security of random sources, ” Public-Key Cryptography, vol.1560, LNCS, pp.29-42, Springer-Verlag, 1999.

2. [2] K. Hamano, F. Satoh, and M. Ishikawa, “Randomness test using discrete Fourier transform, ” Technical Report 6841, Technical Research and Development Institute, Japan Defense Agency, Sept. 2003.

3. [3] K. Hamano, “The distribution of the spectrum for the discrete Fourier transform test included in SP800-22, ” IEICE Trans. Fundamentals, vol.E88-A, no.1, pp.67-73, Jan. 2005.

4. [4] K. Hamano, “Correction of overlapping template matching test included in NIST randomness test suite, ” Technical Report 6944, Technical Research and Development Institute, Japan Defense Agency, Oct. 2006.

5. [5] K. Hamano and T. Kaneko, “Correction of overlapping template matching test included in NIST randomness test suite, ” IEICE Trans. Fundamentals, vol.E90-A, no.9, pp.1788-1792, Sept. 2007.

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