Electron-Impact Ionization Cross-Sections of Silane-Reference-Cited by-同舟云学术

Electron-Impact Ionization Cross-Sections of Silane

Published:2014-10 Issue:5 Volume:20 Page:361-366
ISSN:1469-0667
Container-title:European Journal of Mass Spectrometry
language:en
Short-container-title:Eur J Mass Spectrom (Chichester)

Author:

Saini Sham Singh¹,Bhatt Praveen¹,Bhardwaj Umesh²,Bhardwaj Santosh²

Affiliation:

1. Samalkha Group of Institutions, Samalkha, Panipat, Haryana, India 132115

2. Hindu (PG) College, Sonepat, Haryana, India 131001

Abstract

We have made a study of the total ionization cross-sections of a silane (SiH4) molecule caused by electron impact for a single ionization. Electron-impact ionization cross-sections (EIICS) have been calculated from threshold ionization energy to 1400 eV. The theoretical model, developed by Jain and Khare, has been used to calculate the EIICS for silane. We observed the following product ions: SiH3+, SiH2+, SiH+, Si+, H2+ and H+. The predicted EIICS of silane for all six fragment ions are compared with other theoretical and experimental data. The present model shows a good agreement with the previously reported data.

Publisher

SAGE Publications

Subject

Spectroscopy,Atomic and Molecular Physics, and Optics,General Medicine

Link

http://journals.sagepub.com/doi/pdf/10.1255/ejms.1294

Reference18 articles.

1. Mass spectrometry detection of radicals in SiH4-CH4-H2glow discharge plasmas

2. Absolute measurements of photoabsorption and photoionization cross sections of disilane in the 13–40 eV region

3. Photoionization mass spectrometric studies of SiHn (n=1–4)

4. Multiphoton ionization of SiH3 and SiD3 radicals: Electronic spectra, vibrational analyses of the ground and Rydberg states, and ionization potentials

5. Total and partial electron collisional ionization cross sections for CH4, C2H6, SiH4, and Si2H6