Angle-Resolved Photoemission Measurement along the van-der-Waals Stacking Direction of ZrTe<sub>3</sub>-Reference-Cited by-同舟云学术

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Angle-Resolved Photoemission Measurement along the van-der-Waals Stacking Direction of ZrTe₃

Published:2022-09-15 Issue:9 Volume:91 Page:
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Maki Makoto¹^ORCID,Fujimoto Yuji¹,Yamamoto Isamu²,Azuma Junpei²,Kobayashi Sora³,Demura Satoshi⁴,Sakata Hideaki³

Affiliation:

1. Department of Physics, Saga University, Saga 840-8502, Japan

2. Synchrotron Light Application Center, Saga University, Saga 840-8502, Japan

3. Department of Physics, Tokyo University of Science, Shinjuku, Tokyo 162-8601, Japan

4. Department of Physics, College of Science and Technology, Nihon University, Chiyoda, Tokyo 101-8308, Japan

Funder

Takahashi Industrial and Economic Research Foundation

Publisher

Physical Society of Japan

Subject

General Physics and Astronomy

Link

https://journals.jps.jp/doi/pdf/10.7566/JPSJ.91.094708

Reference25 articles.

1. Electronic crystals: an experimental overview

2. The Peierls instability and charge density wave in one-dimensional electronic conductors

3. Ultrafast electron dynamics in the charge density wave material TbTe3

4. Misconceptions associated with the origin of charge density waves

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