Secondary Ion Emission during the Proton Bombardment of Metal Surfaces-Reference-Cited by-同舟云学术

Secondary Ion Emission during the Proton Bombardment of Metal Surfaces

Published:2018-03-01 Issue:1 Volume:19 Page:49-69
ISSN:1608-1021
Container-title:Uspehi Fiziki Metallov
language:
Short-container-title:Usp. Fiz. Met.

Author:

Cherepin V. T.¹,Vasylyev M. O.¹,Makeeva I. M.¹,Kolesnik V. M.¹,Voloshko S. M.²

Affiliation:

1. G.V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine

2. National Technical University of Ukraine ‘Igor Sikorsky Kyiv Polytechnic Institute’, 37 Peremohy Ave., UA-03056 Kyiv, Ukraine

Publisher

National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka)

Subject

Metals and Alloys,Surfaces, Coatings and Films,Fluid Flow and Transfer Processes,Condensed Matter Physics,Materials Science (miscellaneous),Electronic, Optical and Magnetic Materials

Reference52 articles.

1. V. I. Veksler, Vtorichnaya Ionnaya Ehmissiya Metallov [Secondary Ion Emission of Metals] (Moscow: Nauka: 1978) (in Russina).

2. V. T. Cherepin and M. A. Ivanov, Vtorichnaya Ionno-Ionnaya Ehmissiya Metallov i Splavaov [Secondary Ion-Ion Emission of Metals and Alloys] (Moscow: Nauka: 1975) (in Russina).

3. V. T. Cherepin, Ionnyy Zond [ion Probe] (Kiev: Naukova Dumka: 1981) [in Russian].

4. V. T. Cherepin, Ionnyy Mikrozondovyy Analiz [Ion Microprobe Analysis] (Kiev: Naukova Dumka: 1981) (in Russina).

5. V. T. Cherepin and M. A. Vasiliev, Metody i Pribory dlya Analiza Poverkhnosti Materialov [Methods and Devices for Analysis of the Material Surfaces] (Kiev: Naukova Dumka: 1982) (in Russian).

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