Structural investigation of As-Se chalcogenide thin films with different compositions: formation, characterization and peculiarities of volume and near-surface nanolayers-Reference-Cited by-同舟云学术

Structural investigation of As-Se chalcogenide thin films with different compositions: formation, characterization and peculiarities of volume and near-surface nanolayers

Published:2017-12-18 Issue:4 Volume:24 Page:547-554
ISSN:1027-5495
Container-title:Functional materials
language:
Short-container-title:Funct.Mater.

Author:

Kondrat O.,

Publisher

National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka)

Subject

General Materials Science

Reference26 articles.

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4. Doped amorphous selenium based photoreceptors for electroradiography: Determination of x-ray sensitivity

5. Photostructural changes in chalcogenide glasses

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