Abstract
Abstract
In this note, we demonstrate direct high-temperature growth of single-crystalline GaN on c-plane ScAlMgO4 substrates by metalorganic chemical vapor deposition, without using low-temperature buffers. We found that a trimethylaluminium preflow was crucial to suppress island growth and to achieve uniform mirror-like Ga-polar GaN layers. The preflow time was found to have a direct impact on the crystalline quality of GaN. We also show that thin GaN layers directly grown at high temperature can be used as buffers for the growth of lattice-matched In0.17Ga0.83N layers on ScAlMgO4. The presented results demonstrate the potential of direct growth of GaN on ScAlMgO4.
Funder
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
15 articles.
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