Dependency of direct and inverse transverse piezoelectric properties on composition in self-polarized epitaxial (K x Na1−x )NbO3 films grown via a hydrothermal method-Reference-Cited by-同舟云学术

Dependency of direct and inverse transverse piezoelectric properties on composition in self-polarized epitaxial (K x Na1−x )NbO3 films grown via a hydrothermal method

Published:2020-08-13 Issue:SP Volume:59 Page:SPPC03
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Tateyama Akinori,Ito Yoshiharu,Shimizu Takao^ORCID,Orino Yuichiro,Kurosawa Minoru,Yoshimura Takeshi,Funakubo Hiroshi^ORCID

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

https://iopscience.iop.org/article/10.35848/1347-4065/aba9b3/pdf

Reference41 articles.

1. Active health monitoring of an aircraft wing with embedded piezoelectric sensor/actuator network: I. Defect detection, localization and growth monitoring

2. Ferroelectric thin films: Review of materials, properties, and applications

3. Piezoelectric Thin Films for Sensors, Actuators, and Energy Harvesting

4. Depolarization fields in thin ferroelectric films

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