Abstract
Abstract
The correlation between the magnitude of interlayer exchange coupling (J
ex) and charge-to-spin conversion efficiency (spin Hall angle: θ
SH) is investigated in a synthetic antiferromagnetic (AF) system with compensated magnetization. The magnitude of θ
SH increases linearly with increasing the magnitude of J
ex. We observe the factor of 6.5 increase of spin Hall angle (θ
SH = 45.8%) in a low resistive (ρ
xx = 41 μΩcm) synthetic AF system by increasing the magnitude of J
ex. The low resistive synthetic AF system will be a promising building block for future nonvolatile high-speed memories and logic circuits using the spin Hall effect.
Funder
JSPS KAKENHI
MEXT Initiative to Establish Next-generation Novel Integrated Circuits Centers
Subject
General Physics and Astronomy,General Engineering
Cited by
3 articles.
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