Longitudinal and transverse spatial beam profile measurement of relativistic electron bunch by electro-optic sampling-Reference-Cited by-同舟云学术

Longitudinal and transverse spatial beam profile measurement of relativistic electron bunch by electro-optic sampling

Published:2021-01-15 Issue:2 Volume:14 Page:026503
ISSN:1882-0778
Container-title:Applied Physics Express
language:
Short-container-title:Appl. Phys. Express

Author:

Ota Masato^ORCID,Kan Koichi,Komada Soichiro,Arikawa Yasunobu,Shimizu Tomoki,Mag-usara Valynn Katrine^ORCID,Sakawa Youichi,Matsui Tatsunosuke^ORCID,Nakajima Makoto^ORCID

Abstract

Abstract Electro-optic (EO) sampling is employed to measure the electric field profiles generated by a relativistic electron bunch along the propagation and in the radial directions. The longitudinal (temporal) profile is investigated by changing the time delay between the electron bunch and the pulsed probe laser, while the transverse (radial) profile is acquired by laterally shifting the path of the electron bunch. Experimental results show good agreement with three-dimensional particle-in-cell calculations. We demonstrated a promising method to simultaneously obtain the longitudinal and transverse beam sizes by utilizing the detected spatio-temporal electric field distribution around the electron bunch.

Funder

National Institute for Fusion Science

Japan Society for the Promotion of Science

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

Link

https://iopscience.iop.org/article/10.35848/1882-0786/abd867/pdf

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