A High-Precision Optical Polarimeter to Measure Inclinations of High-Mass X-Ray Binaries-Reference-Cited by-同舟云学术

A High-Precision Optical Polarimeter to Measure Inclinations of High-Mass X-Ray Binaries

Published:2008-12 Issue:874 Volume:120 Page:1282-1297
ISSN:0004-6280
Container-title:Publications of the Astronomical Society of the Pacific
language:en
Short-container-title:PUBL ASTRON SOC PAC

Author:

Wiktorowicz Sloane J.,Matthews Keith

Publisher

IOP Publishing

Subject

Space and Planetary Science,Astronomy and Astrophysics

Reference23 articles.

1. Polarimetric accuracy required for the determination of binary inclinations

2. The variability of polarized standard stars

3. P. Bastien, E. Vernet, L. Drissen, F. Menard, A. F. J. Moffat, C. Robert, N. St-Louis, and C. Sterken, 2007 , inThe Future of Photometric, Spectrophotometric and Polarimetric Standardization,ASP Conf. Ser. 364 , ed.(San Francisco:ASP),529

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