Author:
Dilhaire Stefan,Jorez Sebastien,Lopez Luis-David Patino,Claeys Wilfrid,Batsale Jean-Christophe
Reference6 articles.
1. T. Phan, S. Dilhaire, V. Quintard, D. Lewis and W. Claeys. Thermoreflectance measurements of transient temperature upon integrated circuits : Application to thermal conductivity identification. Microelectronics Journal, vol 29, Nos 4-5, pp 170-180, 1998.
2. V. Quintard, S. Dilhaire, C. Rauzan, T. Phan and W. Claeys. Measurement of absolute temperatures upon metallic lines under current stress by laser probing. IEEE Transactions on Instrumentation and Measurement, Vol 48, no 01, p 69, 1999.
3. W. Claeys, S. Dilhaire, and E. Schaub. Laser probing techniques and methods for the thermal characterization of microelectronic components Thermal Management of Electronic Systems, J.-P. Bardon, E. Beyne, J.-B. Saulnier Editors. ELSEVIER Paris, pp227-237, 1998. ISBN2-84299-033-1.
4. G. Fiege, A. Altes, R. Heiderrhoff and L. Balk. Quantitative thermal conductivity measurement with nanometer resolution J. Phys. D : Appl. Phys. 32 (1999)L13-L17.
5. J.C Batsale, D. Maillet, and A. Degiovani.Extension de la methode des quadripoles thermiques a l'aide de transformations integrates - calcul du transfert thermique au travers d'un defaut plan bidimensionnel. Int. J. Heat and Mass Tranfer, Vol. 37, (1) 1994, pp 111-127.