Computer Simulation of Point-Defect Fields and Microdefect Patterns in Czochralski-Grown Si Crystals-Reference-Cited by-同舟云学术

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Computer Simulation of Point-Defect Fields and Microdefect Patterns in Czochralski-Grown Si Crystals

Published:2002-02-15 Issue:Part 1, No. 2A Volume:41 Page:464-471
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Puzanov Nikolai I.,Eidenzon Anna M.,Puzanov Dmitri N.,Furukawa Jun,Harada Kazuhiro,Ono Naoki,Shimanuki Yasushi

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/41/i=2R/a=464/pdf

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Intrinsic point defect incorporation in silicon single crystals grown from a melt, revisited;Journal of Applied Physics;2011-09-15

2. Heat transfer—a review of 2002 literature;International Journal of Heat and Mass Transfer;2005-02

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