Dielectric Constants on Mixture Thin Films of Barium Carbide and Barium Nitrate Deposited on Silicon Wafers by Barium Carbonate Electron Beam Evaporation Using Nitrogen Molecular and Ion Beams
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Published:2006-12-07
Issue:12
Volume:45
Page:9129-9136
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:en
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Yokota Katsuhiro,Teramoto Yuuki
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering