Scanning Tunneling Microscopy Combined with Hard X-ray Microbeam of High Brilliance from Synchrotron Radiation Source-Reference-Cited by-同舟云学术

Scanning Tunneling Microscopy Combined with Hard X-ray Microbeam of High Brilliance from Synchrotron Radiation Source

Published:2006-03-27 Issue:3B Volume:45 Page:1913-1916
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Saito Akira,Maruyama Junpei,Manabe Ken,Kitamoto Katsuyuki,Takahashi Koji,Takami Kazuhiro,Hirotsune Shinji,Takagi Yasumasa,Tanaka Yoshihito,Miwa Daigo,Yabashi Makina,Ishii Masahi,Akai-Kasaya Megumi,Shin Shik,Ishikawa Tetsuya,Kuwahara Yuji,Aono Masakazu

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

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