Study of Tin Diffusion into Silicon by Backscattering Analysis-Reference-Cited by-同舟云学术

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Study of Tin Diffusion into Silicon by Backscattering Analysis

Published:1974-10 Issue:10 Volume:13 Page:1533-1540
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Akasaka Youichi,Horie Kazuo,Nakamura Genshiro,Tsukamoto Katsuhiro,Yukimoto Yoshinori

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/13/i=10/a=1533/pdf

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