Simulation of Atomic Force Microscopy Image Variations along the Surface Normal: Presence of Possible Resolution Limit in the Attractive Force Range-Reference-Cited by-同舟云学术

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Simulation of Atomic Force Microscopy Image Variations along the Surface Normal: Presence of Possible Resolution Limit in the Attractive Force Range

Published:1995-06-15 Issue:Part 2, No. 6B Volume:34 Page:L789-L792
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Komiyama Masaharu,Tsujimichi Kazuya,Ohkubo Shin'ya,Tazawa Katsuyuki,Kubo Momoji,Miyamoto Akira

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles;Ultramicroscopy;2023-11

2. Self-Adsorption on a Pt (111) Surface;The Journal of Physical Chemistry C;2009-08-13

3. Analysis of energy and force of Pt adatom on Pt (001) surface by MAEAM;Applied Surface Science;2006-05

4. Analysis of energy and force of self-adatom on Pt(110) surface by modified analytical embedded-atom method;Acta Physica Sinica;2006

5. Molecular dynamics simulation of non-contact atomic force microscopy of self-assembled monolayers on Au(111);Nanotechnology;2004-03-26

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