Direct Trap-Density Analysis with Junction Capacitance Transient: Trap Density Spectroscopy (TDS)-Reference-Cited by-同舟云学术

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Direct Trap-Density Analysis with Junction Capacitance Transient: Trap Density Spectroscopy (TDS)

Published:1985-06-20 Issue:Part 2, No. 6 Volume:24 Page:L437-L438
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Okumura Tsugunori

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Precise analyses of photoelectrochemical reactions on particulate Zn_0.25Cd_0.75Se photoanodes in nonaqueous electrolytes using Ru bipyridyl complexes as a probe;Chemical Science;2024

2. Effects of deep defect concentration on junction space charge capacitance measurements;Journal of Applied Physics;2007-05

3. Annealing and Measurement Temperature Dependence of W2B- and W2B5-Based Rectifying Contacts to p-GaN;Journal of Electronic Materials;2007-02-02

4. ICTS measurements for p-GaN Schottky contacts;Applied Surface Science;2002-05

5. Characterization of Ti2+/Ti3+ donor level in ZnSe by isothermal capacitance transient spectroscopy;Applied Physics Letters;1997-03-24

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