Hard-X-ray Phase-Difference Microscopy with a Low-Brilliance Laboratory X-ray Source-Reference-Cited by-同舟云学术

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Hard-X-ray Phase-Difference Microscopy with a Low-Brilliance Laboratory X-ray Source

Published:2011-06-13 Issue:6 Volume:4 Page:062502
ISSN:1882-0778
Container-title:Applied Physics Express
language:en
Short-container-title:Appl. Phys. Express

Author:

Kuwabara Hiroaki,Yashiro Wataru,Harasse Sébastien,Mizutani Haruo,Momose Atsushi

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

Link

http://stacks.iop.org/1882-0786/4/i=6/a=062502/pdf

Reference29 articles.

1. Nanoscale X-ray imaging

2. Phase‐Sensitive X‐Ray Imaging

3. Recent Advances in X-ray Phase Imaging

4. Coherent methods in the X-ray sciences

5. Microscopic imaging and holography with hard X-rays using Fresnel zone-plates

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1. Development of grating-based super-resolution x-ray phase imaging;PROCEEDINGS OF THE 15TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY – XRM2022;2023

2. Freestanding high-aspect-ratio gold masks for low-energy, phase-based x-ray microscopy;Nanotechnology;2022-11-07

3. X-ray phase-sensitive microscope imaging with a grating interferometer: Theory and simulation;Chinese Physics B;2022-09-01

4. Reconstruction method for grating-based x-ray phase tomographic microscope;Developments in X-Ray Tomography XIII;2021-10-04

5. Fabrication of X-ray absorption grating by thermal composite method;Japanese Journal of Applied Physics;2021-06-28

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