X-Ray Photoelectron Spectroscopy of Si–As–Te Chalcogenide Glasses Prepared in the Earth's Gravity and in Microgravity-Reference-Cited by-同舟云学术

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X-Ray Photoelectron Spectroscopy of Si–As–Te Chalcogenide Glasses Prepared in the Earth's Gravity and in Microgravity

Published:1997-03-15 Issue:Part 1, No. 3A Volume:36 Page:987-990
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Shams-Kolahi Wahid,Kobayashi Michihiro,Hanzawa Hiromasa,Matsumura Michio,Kobayashi Hikaru,Okamoto Hiroaki,Endo Shoichi,Kobayashi Yuki,Hamakawa Yoshihiro

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray photoelectron spectroscopy studies of thin GexSb40−xS60 chalcogenide films;Journal of Non-Crystalline Solids;2002-01

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