Holographic Analysis of Incident Electron Beam Angular Distribution of Characteristic X-rays: Internal Detector Electron Holography-Reference-Cited by-同舟云学术

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Holographic Analysis of Incident Electron Beam Angular Distribution of Characteristic X-rays: Internal Detector Electron Holography

Published:2006-05-15 Issue:5 Volume:75 Page:053601
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Hayashi Kouichi¹,Matsushita Tomohiro²,Matsubara Eiichiro³

Affiliation:

1. Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577

2. Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198

3. Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501

Publisher

Japan Society of Applied Physics

Subject

General Physics and Astronomy

Link

http://journals.jps.jp/doi/pdf/10.1143/JPSJ.75.053601

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray Fluorescence Holography Measurement of Oxynitride Thin Film of CaTaO₂N;e-Journal of Surface Science and Nanotechnology;2021-10-16

2. Anion arrangement analysis of oxynitride perovskite thin film with inverse photoelectron holography;Journal of Electron Spectroscopy and Related Phenomena;2021-01

3. Local Structure Measurement Around Light Elements by Using Inverse Photoelectron Holography;physica status solidi (b);2018-10-25

4. Negative Photoelectron Diffraction Replica in Secondary Electron Angular Distribution;Journal of the Physical Society of Japan;2012-01-15

5. 3D Atomic Imaging by Internal-Detector Electron Holography;Physical Review Letters;2011-07-19

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