In situReal-Time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growth for Understanding Strain Relaxation Mechanisms-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

In situReal-Time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growth for Understanding Strain Relaxation Mechanisms

Published:2009-07-17 Issue: Volume:2 Page:085501
ISSN:1882-0778
Container-title:Applied Physics Express
language:en
Short-container-title:Appl. Phys. Express

Author:

Sasaki Takuo,Suzuki Hidetoshi,Sai Akihisa,Lee Jong-Han,Takahasi Masamitu,Fujikawa Seiji,Arafune Koji,Kamiya Itaru,Ohshita Yoshio,Yamaguchi Masafumi

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

Link

http://stacks.iop.org/1882-0786/2/i=8/a=085501/pdf

Reference19 articles.

1. Influence of lattice misfit on heterojunction bipolar transistors with lattice‐mismatched InGaAs bases

2. Graded InxGa1−xAs/GaAs 1.3 μm wavelength light emitting diode structures grown with molecular beam epitaxy

3. 40% efficient metamorphic GaInP∕GaInAs∕Ge multijunction solar cells

4. 40.8% efficient inverted triple-junction solar cell with two independently metamorphic junctions

5. In-situ X-ray imaging of III–V strained-layer relaxation processes

Cited by 39 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Feature extraction and spatial imaging of synchrotron radiation X-ray diffraction patterns using unsupervised machine learning;Science and Technology of Advanced Materials: Methods;2024-04-15

2. Inhomogeneous in-plane distribution of preferential glide planes of β dislocations in a metamorphic InGaAs solar cell;Applied Physics Express;2020-12-11

3. In-situ X-ray diffraction analysis of GaN growth on graphene-covered amorphous substrates;Japanese Journal of Applied Physics;2020-06-12

4. Relaxation and tilting of single and double layer structures of AlGaSb/GaSb-LPE studied by high resolution x-ray diffraction;Materials Research Express;2020-03-01

5. Synchrotron Radiation-Based Techniques Available at QST Advanced Characterization Nanotechnology Platform (National Institutes for Quantum and Radiological Science and Technology);Materia Japan;2019-12-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3