Metrology of Wide Field of View Nano-Thickness Foils' Homogeneity by Conventional and Phase Contrast Soft X-ray Imaging-Reference-Cited by-同舟云学术

Metrology of Wide Field of View Nano-Thickness Foils' Homogeneity by Conventional and Phase Contrast Soft X-ray Imaging

Published:2010-06-21 Issue:6 Volume:49 Page:06GK03
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Faenov Anatoly,Pikuz Tatiana,Fukuda Yuji,Kando Masaki,Kotaki Hideyuki,Homma Takayuki,Kawase Keigo,Skobelev Igor,Gasilov Sergei,Kawachi Tetsuya,Daido Hiroyuki,Tajima Toshiki,Kato Yoshiaki,Bulanov Sergei

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Reference16 articles.

1. X-ray laser beam with diffraction-limited divergence generated with two gain media

2. Dramatic Enhancement of High-Order Harmonic Generation

3. Table-top soft x-ray imaging of nanometric films

4. Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector

5. Phase-contrast imaging of nanostructures by soft x rays from a femtosecond-laser plasma

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