Twins and Intergrowth Defects in High-TcBi-Sr-Ca-Cu-O Superconductor Examined by High-Resolution Electron Microscopy-Reference-Cited by-同舟云学术

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Twins and Intergrowth Defects in High-TcBi-Sr-Ca-Cu-O Superconductor Examined by High-Resolution Electron Microscopy

Published:1988-05-20 Issue:Part 2, No. 5 Volume:27 Page:L827-L829
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Matsui Yoshio,Maeda Hiroshi,Tanaka Yoshiaki,Takayama-Muromachi Eiji,Takekawa Shunji,Horiuchi Shigeo

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

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4. Single atomic layer detection of Ca and defect characterization of Bi-2212 with EELS in HA-ADF STEM;Ultramicroscopy;2006-10

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