Hot Carrier Degradations of Dynamic Threshold Silicon on Insulator p-Type Metal–Oxide–Semiconductor Field Effect Transistors
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Published:2004-04-09
Issue:4A
Volume:43
Page:1300-1304
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:en
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Chao Tien-Sheng,Lee Yao-Jen,Huang Chun-Yang,Lin Horng-Chih,Li Yiming,Huang Tiao-Yuan
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering