Thermal Aging Effect in Poled Ferroelectric SrBi2(Ta,Nb)2O9Capacitors-Reference-Cited by-同舟云学术

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Thermal Aging Effect in Poled Ferroelectric SrBi2(Ta,Nb)2O9Capacitors

Published:1999-05-15 Issue:Part 1, No. 5A Volume:38 Page:2816-2819
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Shimada Yasuhiro,Noma Atsushi,Nakao Keisaku,Otsuki Tatsuo

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. IMPRINT BEHAVIOR OF FERROELECTRIC Pb(ZrTi)O3 THIN-FILM CAPACITORS IN THE EARLY STAGE;Integrated Ferroelectrics;2008-06-10

2. Effects of Storage Conditions on Imprint Characteristics in SrBi2Ta2O9Capacitors;Japanese Journal of Applied Physics;2006-09-22

3. Dependences of Process-Induced Damage on Imprint Characteristics in SrBi2Ta2O9Capacitors;Japanese Journal of Applied Physics;2005-09-22

4. Evaluation of Imprint Property of (111)-Highly Oriented Lead Zirconate Titanate (PZT)-Base Ferroelectric Material;Japanese Journal of Applied Physics;2005-09-22

5. Time and temperature dependencies of imprint characteristics in SrBi2Ta2O9 capacitors;Applied Physics Letters;2005-04-18

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