Estimation of Emission Cross Section for CH+(A1Π-X1Σ+: 419.0–441.0 nm) Produced by Electron Impact of CH4Using Spectral Simulation Technique-Reference-Cited by-同舟云学术

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Estimation of Emission Cross Section for CH+(A1Π-X1Σ+: 419.0–441.0 nm) Produced by Electron Impact of CH4Using Spectral Simulation Technique

Published:1999-01-15 Issue:1 Volume:68 Page:64-70
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Motohashi Kenji¹,Tsurubuchi Seiji¹

Affiliation:

1. Department of Applied Physics, Tokyo University of Agriculture and Technology, Tokyo 184-8588

Publisher

Physical Society of Japan

Subject

General Physics and Astronomy

Link

http://journals.jps.jp/doi/pdf/10.1143/JPSJ.68.64

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Maximising rovibrational assignments in the ν1 band of NSCl by spectral analysis by subtraction of simulated intensities (SASSI);Journal of Molecular Spectroscopy;2006-07

2. Reading between the lines: Exposing underlying features of high resolution infrared spectra (CHClF2);Physical Chemistry Chemical Physics;2003

3. Single-hole one-electron superexcited states and doubly excited states of methane in the vacuum ultraviolet range as studied by dispersed fluorescence spectroscopy;Journal of Physics B: Atomic, Molecular and Optical Physics;2002-10-17

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