Characterization of an Imaging Extreme-Ultraviolet Flat-Field Spectrometer and Its Application to Extreme-Ultraviolet Emission Profile Measurement-Reference-Cited by-同舟云学术

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Characterization of an Imaging Extreme-Ultraviolet Flat-Field Spectrometer and Its Application to Extreme-Ultraviolet Emission Profile Measurement

Published:2000-10-15 Issue:Part 1, No. 10 Volume:39 Page:6062-6066
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Kim Jaehoon,Kim Dong-Eon

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Prepulse effect on laser-induced water-window radiation from a liquid nitrogen jet;Applied Physics Letters;2007-06-25

2. Optimization study of a soft x-ray flat field spectrometer;Acta Physica Sinica;2004

3. Measurement of the degree of polarization of the spectra from laser-produced Al plasma;Applied Surface Science;2002-09

4. Measurement of the degree of polarization of the spectra from laser produced recombining Al plasmas;Physical Review E;2002-07-22

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