Author:
Seidel Peter,Geyer Maximilian,Lehninger David,Schneider Frank,Klemm Volker,Heitmann Johannes
Abstract
In this paper our recent research on Ge nanoparticles embedded in ZrO2 will be reviewed. Ge nanoparticles have been deposited by rf-cosputtering of Ge1.6ZrO2/ZrO2 superlattices and subse-quent annealing. TEM measurements confirmed the phase separation of the two compounds and the forming of ex-tended nanocrystalline Ge layers at 650°. These layers show a luminescence signal at 2.5 eV, which is contributed to defect luminescence.
Publisher
The Electrochemical Society
Cited by
3 articles.
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