(Invited) Characterization of Interfacial Dipoles at Dielectric Stacks by XPS Analysis
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Published:2017-08-16
Issue:1
Volume:80
Page:229-235
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ISSN:1938-6737
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Container-title:ECS Transactions
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language:en
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Short-container-title:ECS Trans.
Author:
Miyazaki Seiichi,Ohta Akio,Fujimura Nobuyuki
Publisher
The Electrochemical Society