Author:
Yamaha Takashi,Nakatsuka Osamu,Takeuchi Shotaro,Takeuchi Wakana,Taoka Noriyuki,Araki Koji,Izunome Koji,Zaima Shigeaki
Abstract
We have examined the epitaxial growth of Ge1-x-ySixSny layers on Ge substrates with a Sn content of 3~15% with low temperature molecular beam epitaxy method. The Ge1-x-ySixSny layers are psuedomorphically grown on Ge substrates with high crystalline quality. The surface morphology of the Ge1-x-ySixSny layers with a Sn content below 7% shows very flat and uniform, although surface roughening occurs in the sample with a Sn content as high as 15% provably due to the Sn precipitation. We also roughly estimated the energy band structure with liner approximation calculation. The energy bandgap of Ge1-x-ySixSny alloy prepared in this study is expected to be 0.8~1.0 eV at the L or X point.
Publisher
The Electrochemical Society
Cited by
16 articles.
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