Author:
De Gryse O.,Clauws P.,Vanhellemont J.,Lebedev O. I.,Van Landuyt J.,Simoen E.,Claeys C.
Publisher
The Electrochemical Society
Subject
Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Reference27 articles.
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4. H. Takeno, K. Aihara, Y. Hayamizu, and Y. Kitagawara, inSemiconductor SiliconVIII, H. R. Huff, H. Tsuya, and U. Gösele, Editors, PV 98-1, Vol. 2, p. 1012, The Electrochemical Society Proceedings Series, Pennington, NJ (1998).
5. Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques
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