Abstract
In this study, a series of β-Ga2O3 films are prepared by using triethylgallium (TEGa) and nitrous oxide (N2O) as precursors to explore the effect of N2O/TEGa ratio on the characteristics of β-Ga2O3 films. A metal/semiconductor/metal (MSM)-type solar blind ultraviolet (UV) photodetector (PD) is fabricated using as-prepared β-Ga2O3 film. It is found that an increment of N2O/TEGa ratio tends to suppress the oxygen vacancies in β-Ga2O3 film so the device performance can be significantly improved. This work gives a deep insight into the impact of TEGa/N2O ratio for depositing β-Ga2O3 on the film quality, the surface morphology, the chemical composition and the device performance for UV PDs.
Publisher
The Electrochemical Society
Subject
Electronic, Optical and Magnetic Materials
Cited by
3 articles.
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