Abstract
In this paper, the author points out that the Poole-Frenkel (P-F) and Schottky emission mechanisms actually can happen simultaneously and a unified Schottky-Poole-Frenkel model can be used to explain a lot of existing experimental data. However, sometimes, the basic unified Schottky-Poole-Frenkel model fails and an extended unified Schottky-Poole-Frenkel model is required to explain experimental data. In this paper, an example of using the basic unified Schottky-Poole-Frenkel model to explain the I-V characteristics of high-k capacitor structures used in analog integrated circuit technology will be presented. Then an example of high-k capacitor structures used in analog integrated circuit technology which require the extended unified Schottky-Poole-Frenkel model will also be provided.
Publisher
The Electrochemical Society
Cited by
3 articles.
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