Masking Considerations in Chemically Assisted Ion Beam Etching of GaAs / AlGaAs Laser Structures
Author:
Affiliation:
1. School of Electrical Engineering, Cornell University, Ithaca, New York 14853
2. School of Applied and Engineering Physics and National Nanofabrication Facility, Cornell University, Ithaca, New York 14853
Publisher
The Electrochemical Society
Subject
Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Link
https://iopscience.iop.org/article/10.1149/1.2096742/pdf
Cited by 19 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Etched facet technology for GaN and blue lasers;SPIE Proceedings;2006-02-09
2. Ion Beam Etching of Compound Semiconductors;Handbook of Advanced Plasma Processing Techniques;2000
3. Fabrication of surface gratings in GaAs and AlGaAs by electron beam lithography and chemically assisted ion beam etching;SPIE Proceedings;1999-09-06
4. Ultrahigh vacuum chemically assisted ion beam etching system with a three grid ion source;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1997-05
5. Chemically Assisted Ion Beam Etching of GaAs/AlGaAs Using Chlorine Ions;Japanese Journal of Applied Physics;1996-07-15
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