Evaluation of the Bulk Lifetime of Silicon Wafers by Immersion in Hydrofluoric Acid and Illumination-Reference-Cited by-同舟云学术

Evaluation of the Bulk Lifetime of Silicon Wafers by Immersion in Hydrofluoric Acid and Illumination

Published:2012 Issue:2 Volume:1 Page:P55-P61
ISSN:2162-8769
Container-title:ECS Journal of Solid State Science and Technology
language:en
Short-container-title:ECS J. Solid State Sci. Technol.

Author:

Grant Nicholas E.,McIntosh Keith R.,Tan Jason T.

Publisher

The Electrochemical Society

Subject

Electronic, Optical and Magnetic Materials

Reference43 articles.

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5. Dimensionless solution of the equation describing the effect of surface recombination on carrier decay in semiconductors

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